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In: Applied Sciences (Switzerland) . (Applied Sciences (Switzerland), July 2023, 13(14))
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Bruzzi, M.; Adey, J.; Al-Ajili, A.; Alexandrov, P.; Alfieri, G.; Allport, P.P.; Andreazza, A.; Artuso, M.; Assouak, S.; Avset, B.S.; Barabash, L.; Baranova, E.; Barcz, A.; Basile, A.; Bates, R.; Belova, N.; Biagi, S.F.; Bilei, G.M.; Bisello, D.; Blue, A.; Blumenau, A.; Boisvert, V.; Bolla, G.; Bondarenko, G.; Borchi, E.; Borrello, L.; Bortoletto, D.; Boscardin, M.; Bosisio, L.; V. Bowcock, T.J.; Brodbeck, T.J.; Broz, J.; Brukhanov, A.; Brzozowski, A.; Buda, M.; Buhmann, P.; Buttar, C.; Campabadal, F.; Campbell, D.; Candelori, A.; Casse, G.; Cavallini, A.; Chilingarov, A.; Chren, D.; Cindro, V.; Citterio, M.; Collins, P.; Coluccia, R.; Contarato, D.; Coutinho, J.; Creanza, D.; Cunningham, W.; Cvetkov, V.; Dalla Betta, G.-F.; Davies, G.; Dawson, I.; de Boer, W.; De Palma, M.; Demina, R.; Dervan, P.; Dierlamm, A.; Dittongo, S.; Dobrzanski, L.; Dolezal, Z.; Dolgolenko, A.; Eberlein, T.; Eremin, V.; Fall, C.; Fasolo, F.; Ferbel, T.; Fizzotti, F.; Fleta, C.; Focardi, E.; Forton, E.; Franchenko, S.; Fretwurst, E.; Gamaz, F.; Garcia, C.; Garcia-Navarro, J.E.; Gaubas, E.; Genest, M.-H.; Gill, K.A.; Giolo, K.; Glaser, M.; Goessling, C.; Golovine, V.; González Sevilla, S.; Gorelov, I.; Goss, J.; Gouldwell, A.; Grégoire, G.; Gregori, P.; Grigoriev, E.; Grigson, C.; Grillo, A.; Groza, A.; Guskov, J.; Haddad, L.; Härkönen, J.; Harding, R.; Hauler, F.; Hayama, S.; Hoeferkamp, M.; Hönniger, F.; Horazdovsky, T.; Horisberger, R.; Horn, M.; Houdayer, A.; Hourahine, B.; Hruban, A.; Hughes, G.; Ilyashenko, I.; Irmscher, K.; Ivanov, A.; Jarasiunas, K.; Jin, T.; Jones, B.K.; Jones, R.; Joram, C.; Jungermann, L.; Kalinina, E.; Kaminski, P.; Karpenko, A.; Karpov, A.; Kazlauskiene, V.; Kazukauskas, V.; Khivrich, V.; Khomenkov, V.; Kierstead, J.; Klaiber-Lodewigs, J.; Kleverman, M.; Klingenberg, R.; Kodys, P.; Kohout, Z.; Korjenevski, S.; Kowalik, A.; Kozlowski, R.; Kozodaev, M.; Kramberger, G.; Krasel, O.; Kuznetsov, A.; Kwan, S.; Lagomarsino, S.; Lari, T.; Lassila-Perini, K.; Lastovetsky, V.; Latino, G.; Latushkin, S.; Lazanu, S.; Lazanu, I.; Lebel, C.; Leinonen, K.; Leroy, C.; Li, Z.; Lindström, G.; Lindstrom, L.; Linhart, V.; Litovchenko, A.; Litovchenko, P.; Litvinov, V.; Lo Giudice, A.; Lozano, M.; Luczynski, Z.; Luukka, P.; Macchiolo, A.; Mainwood, A.; Makarenko, L.F.; Mandić, I.; Manfredotti, C.; Marti i Garcia, S.; Marunko, S.; Mathieson, K.; Mozzanti, A.; Melone, J.; Menichelli, D.; Meroni, C.; Messineo, A.; Miglio, S.; Mikuž, M.; Miyamoto, J.; Moll, M.; Monakhov, E.; Moscatelli, F.; Murin, L.; Nava, F.; Naoumov, D.; Nossarzewska-Orlowska, E.; Nummela, S.; Nysten, J.; Olivero, P.; Oshea, V.; Palviainen, T.; Paolini, C.; Parkes, C.; Passeri, D.; Pein, U.; Pellegrini, G.; Perera, L.; Petasecca, M.; Piatkowski, B.; Piemonte, C.; Pignatel, G.U.; Pinho, N.; Pintilie, I.; Pintilie, L.; Polivtsev, L.; Polozov, P.; Popa, A.I.; Popule, J.; Pospisil, S.; Pucker, G.; Radicci, V.; Rafí, J.M.; Ragusa, F.; Rahman, M.; Rando, R.; Roeder, R.; Rohe, T.; Ronchin, S.; Rott, C.; Roy, P.; Roy, A.; Ruzin, A.; Ryazanov, A.; Sadrozinski, H.F.W.; Sakalauskas, S.; Scaringella, M.; Schiavulli, L.; Schnetzer, S.; Schumm, B.; Sciortino, S.; Scorzoni, A.; Segneri, G.; Seidel, S.; Seiden, A.; Sellberg, G.; Sellin, P.; Sentenac, D.; Shipsey, I.; Sicho, P.; Sloan, T.; Solar, M.; Son, S.; Sopko, B.; Spencer, N.; Stahl, J.; Stavitski, I.; Stolze, D.; Stone, R.; Storasta, J.; Strokan, N.; Strupinski, W.; Sudzius, M.; Surma, B.; Suuronen, J.; Suvorov, A.; Svensson, B.G.; Tipton, P.; Tomasek, M.; Troncon, C.; Tsvetkov, A.; Tuominen, E.; Tuovinen, E.; Tuuva, T.; Tylchin, M.; Uebersee, H.; Uher, J.; Ullán, M.; Vaitkus, J.V.; Vanni, P.; Velthuis, J.; Verzellesi, G.; Verbitskaya, E.; Vrba, V.; Wagner, G.; Wilhelm, I.; Worm, S.; Wright, V.; Wunstorf, R.; Zabierowski, P.; Zaluzhny, A.; Zavrtanik, M.; Zen, M.; Zhukov, V.; Zorzi, N.
In Nuclear Inst. and Methods in Physics Research, A 2005 541(1):189-201
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2014 IEEE Workshop on Wide Bandgap Power Devices and Applications Wide Bandgap Power Devices and Applications (WiPDA), 2014 IEEE Workshop on. :143-146 Oct, 2014
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