학술논문
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Academic Journal
Sun, Y.L.; Obertelli, A.; Doornenbal, P.; Barbieri, C.; Chazono, Y.; Duguet, T.; Liu, H.N.; Navrátil, P.; Nowacki, F.; Ogata, K.; Otsuka, T.; Raimondi, F.; Somà, V.; Utsuno, Y.; Yoshida, K.; Achouri, N.; Baba, H.; Browne, F.; Calvet, D.; Château, F.; Chen, S.; Chiga, N.; Corsi, A.; Cortés, M.L.; Delbart, A.; Gheller, J.-M.; Giganon, A.; Gillibert, A.; Hilaire, C.; Isobe, T.; Kobayashi, T.; Kubota, Y.; Lapoux, V.; Motobayashi, T.; Murray, I.; Otsu, H.; Panin, V.; Paul, N.; Rodriguez, W.; Sakurai, H.; Sasano, M.; Steppenbeck, D.; Stuhl, L.; Togano, Y.; Uesaka, T.; Wimmer, K.; Yoneda, K.; Aktas, O.; Aumann, T.; Chung, L.X.; Flavigny, F.; Franchoo, S.; Gašparić, I.; Gerst, R.-B.; Gibelin, J.; Hahn, K.I.; Kim, D.; Koiwai, T.; Kondo, Y.; Koseoglou, P.; Lee, J.; Lehr, C.; Linh, B.D.; Lokotko, T.; MacCormick, M.; Moschner, K.; Nakamura, T.; Park, S.Y.; Rossi, D.; Sahin, E.; Sohler, D.; Söderström, P.-A.; Takeuchi, S.; Törnqvist, H.; Vaquero, V.; Wagner, V.; Wang, S.; Werner, V.; Xu, X.; Yamada, H.; Yan, D.; Yang, Z.; Yasuda, M.; Zanetti, L.
In Physics Letters B 10 March 2020 802
Report
Liu, H. N.; Obertelli, A.; Doornenbal, P.; Bertulani, C. A.; Hagen, G.; Holt, J. D.; Jansen, G. R.; Morris, T. D.; Schwenk, A.; Stroberg, R.; Achouri, N.; Baba, H.; Browne, F.; Calvet, D.; Château, F.; Chen, S.; Chiga, N.; Corsi, A.; Cortés, M. L.; Delbart, A.; Gheller, J. -M.; Giganon, A.; Gillibert, A.; Hilaire, C.; Isobe, T.; Kobayashi, T.; Kubota, Y.; Lapoux, V.; Motobayashi, T.; Murray, I.; Otsu, H.; Panin, V.; Paul, N.; Rodriguez, W.; Sakurai, H.; Sasano, M.; Steppenbeck, D.; Stuhl, L.; Sun, Y. L.; Togano, Y.; Uesaka, T.; Wimmer, K.; Yoneda, K.; Aktas, O.; Aumann, T.; Chung, L. X.; Flavigny, F.; Franchoo, S.; Gašparić, I.; Gerst, R. -B.; Gibelin, J.; Hahn, K. I.; Kim, D.; Koiwai, T.; Kondo, Y.; Koseoglou, P.; Lee, J.; Lehr, C.; Linh, B. D.; Lokotko, T.; MacCormick, M.; Moschner, K.; Nakamura, T.; Park, S. Y.; Rossi, D.; Sahin, E.; Sohler, D.; Söderström, P. -A.; Takeuchi, S.; Törnqvist, H.; Vaquero, V.; Wagner, V.; Wang, S.; Werner, V.; Xu, X.; Yamada, H.; Yan, D.; Yang, Z.; Yasuda, M.; Zanetti, L.
Phys. Rev. Lett. 122, 072502 (2019)
Academic Journal
Angulo, C.; Casarejos, E.; Coc, A.; Davinson, T.; Achouri, N.; Cortina-Gil, D.; Couder, M.; Figuera, P.; Fulton, B.; Kiener, J.; Leleux, P.; Mukha, I.; Murphy, A.S.; Ninane, A.; Orr, N.; Tatischeff, V.; Vanderbist, F.
In Nuclear Physics, Section A 2005 758:775-778
Conference
2013 IEEE International Test Conference (ITC) Test Conference (ITC), 2013 IEEE International. :1-10 Sep, 2013
Conference
22nd IEEE VLSI Test Symposium, 2004. Proceedings. VLSI test symposium VLSI Test Symposium, 2004. Proceedings. 22nd IEEE. :313-318 2004
Conference
10th IEEE Pacific Rim International Symposium on Dependable Computing, 2004. Proceedings. Dependable computing Dependable Computing, 2004. Proceedings. 10th IEEE Pacific Rim International Symposium on. :315-320 2004
Conference
2003 Design, Automation and Test in Europe Conference and Exhibition Design, automation and test in Europe Design, Automation and Test in Europe Conference and Exhibition, 2003. :590-595 2003
Conference
9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003. On-line testing On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE. :94-98 2003
Conference
ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486) Computer aided design Computer Aided Design, 2003. ICCAD-2003. International Conference on. :588-594 2003
Conference
Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on. :459-466 2003
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[AR] Achouri, N.
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