학술논문

발행년
-
(예 : 2010-2015)
'학술논문' 에서 검색결과 69건 | 목록 60~70
Conference
In: GLOBECOM - IEEE Global Telecommunications Conference, 2011 IEEE Global Telecommunications Conference, GLOBECOM 2011. (GLOBECOM - IEEE Global Telecommunications Conference, 2011)
Conference
In: 2011 IEEE PES Conference on Innovative Smart Grid Technologies - Middle East, ISGT Middle East 2011, 2011 IEEE PES Conference on Innovative Smart Grid Technologies - Middle East, ISGT Middle East 2011. (2011 IEEE PES Conference on Innovative Smart Grid Technologies - Middle East, ISGT Middle East 2011, 2011)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2008: Proceedings from the 34th International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2008, :245-248)
Conference
In: 2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings, 2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings. (2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings, 2007, 4:446-449)
Conference
In: 2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings, 2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings. (2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings, 2007, 1:9-12)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2005 - Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2005, 2005:235-238)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2005 - Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2005, 2005:241-244)
Academic Journal
(1975, :398-401)
검색 결과 제한하기
제한된 항목
[AR] Lai, S.W.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어