학술논문
'학술논문'
에서 검색결과 765건 | 목록
50~60
Academic Journal
Wang, Y.-Y.; Wang, K.-C.; Chang, T.-Y.; Wu, T.-L.; Ronchi, N.; O'Sullivan, B.; Banerjee, K.; van den Bosch, G.; Van Houdt, J.
In: Microelectronics Reliability . (Microelectronics Reliability, November 2022, 138)
Academic Journal
Kittl, J.A.; Opsomer, K.; Popovici, M.; Menou, N.; Kaczer, B.; Wang, X.P.; Adelmann, C.; Pawlak, M.A.; Tomida, K.; Rothschild, A.; Govoreanu, B.; Degraeve, R.; Schaekers, M.; Zahid, M.; Delabie, A.; Meersschaut, J.; Polspoel, W.; Clima, S.; Pourtois, G.; Knaepen, W.; Detavernier, C.; Afanas’ev, V.V.; Blomberg, T.; Pierreux, D.; Swerts, J.; Fischer, P.; Maes, J.W.; Manger, D.; Vandervorst, W.; Conard, T.; Franquet, A.; Favia, P.; Bender, H.; Brijs, B.; Van Elshocht, S.; Jurczak, M.; Van Houdt, J.; Wouters, D.J.
In Microelectronic Engineering 2009 86(7):1789-1795
Academic Journal
Govoreanu, B.; Degraeve, R.; Zahid, M.B.; Nyns, L.; Cho, M.; Kaczer, B.; Jurczak, M.; Kittl, J.A.; Van Houdt, J.
In Microelectronic Engineering 2009 86(7):1807-1811
Academic Journal
In Microelectronic Engineering 2009 86(7):1834-1837
Deterministic and Field-Free Voltage-Controlled MRAM for High Performance and Low Power Applications
Conference
Wu, Y. C.; Kim, W.; Garello, K.; Yasin, F.; Jayakumar, G.; Couet, S.; Carpenter, R.; Kundu, S.; Rao, S.; Crotti, D.; Van Houdt, J.; Groeseneken, G.; Kar, G. S.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Conference
Celano, U.; Chen, Y. H.; Minj, A.; Banerjee, K.; Ronchi, N.; McMitchell, S.; Van Marcke, P.; Favia, P.; Wu, T. L.; Kaczer, B.; Van den Bosch, G.; Van Houdt, J.; van der Heide, P.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Conference
Ravsher, T.; Van Houdt, J.; Afanas'Ev, V.; Degraeve, R.; Garbin, D.; Clima, S.; Fantini, A.; Donadio, G.; Kundu, S.; Devulder, W.; Hody, H.; Potoms, G.; Belmonte, A.; Kar, G.
In: IEEE International Reliability Physics Symposium Proceedings , 2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, 2024)
Academic Journal
Govoreanu, B.; Wellekens, D.; Haspeslagh, L.; Brunco, D.P.; De Vos, J.; Aguado, D. Ruiz; Blomme, P.; van der Zanden, K.; Van Houdt, J.
In Solid State Electronics 2008 52(4):557-563
Conference
Clima, Sergiu; O'Sullivan, B. J; Ronchi, N.; Bardon, M. G.; Banerjee, K.; Van den Bosch, G.; Pourtois, G.; Van Houdt, J.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :4.2.1-4.2.4 Dec, 2020
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(10):4091-4098 Oct, 2017
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[AR] van Houdt, J.
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