학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 77건 | 목록 40~50
Conference
2009 IEEE International Integrated Reliability Workshop Final Report; 2009, p136-137, 2p
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. (Proceedings of SPIE - The International Society for Optical Engineering, 2011, 8036)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2011 - Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2011, :40-45)
Conference
In: Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010, Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010. (Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010, 2010, 1:25-28)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Scanning Microscopy 2010. (Proceedings of SPIE - The International Society for Optical Engineering, 2010, 7729)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2009 - Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2009, :339-345)
Conference
In: Physics Procedia, Proceedings of the 7th International Conference on Charged Particle Optics, CPO-7. (Physics Procedia, August 2008, 1(1):135-141)
Conference
In: Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008, Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008. (Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008, 2008, 1:871-874)
Conference
In: AIP Conference Proceedings, CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology. (AIP Conference Proceedings, 2007, 931:161-167)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Instrumentation, Metrology, and Standards for Nanomanufacturing. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6648)
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제한된 항목
[AR] Notte, J.
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