학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 56건 | 목록 40~50
Conference
In: AIP Conference Proceedings, CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology. (AIP Conference Proceedings, 2007, 931:392-396)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Metrology, Inspection, and Process Control for Microlithography XX. (Proceedings of SPIE - The International Society for Optical Engineering, 2006, 6152 I)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Metrology, Inspection, and Process Control for Microlithography XX. (Proceedings of SPIE - The International Society for Optical Engineering, 2006, 6152 I)
Conference
In: Progress in Biomedical Optics and Imaging - Proceedings of SPIE, Metrology, Inspection, and Process Control for Microlithography XIX. (Progress in Biomedical Optics and Imaging - Proceedings of SPIE, 2005, 5752(I):288-303)
Academic Journal
In: Journal of Micro/Nanolithography, MEMS, and MOEMS. (Journal of Micro/Nanolithography, MEMS, and MOEMS, January-March 2011, 10(1))
Academic Journal
In: IEEE Transactions on Semiconductor Manufacturing. (IEEE Transactions on Semiconductor Manufacturing, February 2009, 22(1):72-79)
Academic Journal
In: Scanning. (Scanning, January 2008, 30(1):47-55)
Academic Journal
In: Measurement Science and Technology. (Measurement Science and Technology, 1 February 2007, 18(2):448-455)
Academic Journal
In: Journal of Micro/Nanolithography, MEMS, and MOEMS. (Journal of Micro/Nanolithography, MEMS, and MOEMS, April/June 2007, 6(2))
Conference
In: Proceedings of the Australian Microelectronics Conference. (Proceedings of the Australian Microelectronics Conference, 1997, :34-35)
검색 결과 제한하기
제한된 항목
[AR] Dixson, R.G.
발행연도 제한
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