학술논문
'학술논문'
에서 검색결과 56건 | 목록
30~40
Conference
Attota, R.; Dixson, R.G.; Kramar, J.A.; Potzick, J.E.; Vladár, A.E.; Bunday, B.; Rudack, A.; Novak, E.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2011, 7971)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. (Proceedings of SPIE - The International Society for Optical Engineering, 2011, 8036)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V. (Proceedings of SPIE - The International Society for Optical Engineering, 2011, 8105)
Conference
Vorburger, T.V.; Hilton, A.; Dixson, R.G.; Orji, N.G.; Powell, J.A.; Trunek, A.J.; Neudeck, P.G.; Abel, P.B.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2010, 7638)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2010, 7638)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Instrumentation, Metrology, and Standards for Nanomanufacturing III. (Proceedings of SPIE - The International Society for Optical Engineering, 2009, 7405)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Instrumentation, Metrology, and Standards for Nanomanufacturing II. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 7042)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6518(PART 1))
Conference
Orji, N.G.; Dixson, R.G.; Cresswella, M.W.; Allen, R.A.; Garcia-Gutierrez, D.I.; Bunday, B.D.; Bishop, M.; Allgair, J.A.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6518(PART 1))
Conference
Allen, R.A.; Dixson, R.G.; Guthrie, W.F.; Shulver, B.J.R.; Bunting, A.S.; Stevenson, J.T.M.; Walton, A.J.; Cresswell, M.W.
In: AIP Conference Proceedings , CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology. (AIP Conference Proceedings, 2007, 931:387-391)
검색 결과 제한하기
제한된 항목
[AR] Dixson, R.G.
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