학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 56건 | 목록 30~40
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Metrology, Inspection, and Process Control for Microlithography XXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2011, 7971)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. (Proceedings of SPIE - The International Society for Optical Engineering, 2011, 8036)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V. (Proceedings of SPIE - The International Society for Optical Engineering, 2011, 8105)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Metrology, Inspection, and Process Control for Microlithography XXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2010, 7638)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Metrology, Inspection, and Process Control for Microlithography XXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2010, 7638)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Instrumentation, Metrology, and Standards for Nanomanufacturing III. (Proceedings of SPIE - The International Society for Optical Engineering, 2009, 7405)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Instrumentation, Metrology, and Standards for Nanomanufacturing II. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 7042)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Metrology, Inspection, and Process Control for Microlithography XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6518(PART 1))
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Metrology, Inspection, and Process Control for Microlithography XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6518(PART 1))
Conference
In: AIP Conference Proceedings, CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology. (AIP Conference Proceedings, 2007, 931:387-391)
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제한된 항목
[AR] Dixson, R.G.
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