학술논문
'학술논문'
에서 검색결과 40건 | 목록
30~40
Conference
Nicoletti, S.; Fédéli, J.-M.; Fournier, M.; Labeye, P.; Barritault, P.; Marchant, A.; Glière, A.; Teulle, A.; Coutard, J.-G.; Duraffourg, L.
In: Proceedings of SPIE - The International Society for Optical Engineering , Silicon Photonics XIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2019, 10923)
Conference
Labeye, P.; Koshkinbayeva, A.; Dupoy, M.; Barritault, P.; Lartigue, O.; Fournier, M.; Fedeli, J.-M.; Boutami, S.; Garcia, S.; Nicoletti, S.; Duraffourg, L.
In: Proceedings of SPIE - The International Society for Optical Engineering , Integrated Optics: Devices, Materials, and Technologies XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2017, 10106)
Conference
In: Advanced Solid State Lasers, ASSL 2015 , Advanced Solid State Lasers, ASSL 2015. (Advanced Solid State Lasers, ASSL 2015, 2015)
Conference
In: Optics InfoBase Conference Papers , Frontiers in Optics, FIO 2013. (Optics InfoBase Conference Papers, 2013)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6518(PART 2))
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , 36th Annual Boulder Damage Symposium Proceedings: Laser-Induced Damage in Optical Materials: 2004. (Proceedings of SPIE - The International Society for Optical Engineering, 2005, 5647:188-196)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XVIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2004, 5375(PART 1):210-221)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Advances in Optical Thin Films. (Proceedings of SPIE - The International Society for Optical Engineering, 2004, 5250:12-20)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XVIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2004, 5375(PART 2):1302-1313)
Academic Journal
In: REE, Revue de L'Electricite et de L'Electronique . (REE, Revue de L'Electricite et de L'Electronique, October 2004, 2004(9):50-55)
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제한된 항목
[AR] Barritault, P.
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