학술논문
'학술논문'
에서 검색결과 1,472건 | 목록
20~30
Academic Journal
In: BMC Medical Informatics and Decision Making . (BMC Medical Informatics and Decision Making, December 2023, 23(1))
Academic Journal
In Microelectronic Engineering 25 June 2017 178:262-265
Academic Journal
In Microelectronic Engineering 25 June 2017 178:254-257
Academic Journal
In Neurochirurgie June 2017 63(3):175-180
Academic Journal
Sunbul, A.; Ali, T.; Mertens, K.; Revello, R.; Lehninger, D.; Muller, F.; Lederer, M.; Kuhnel, K.; Rudolph, M.; Oehler, S.; Hoffmann, R.; Zimmermann, K.; Biedermann, K.; Schramm, P.; Czernohorsky, M.; Seidel, K.; Kampfe, T.; Eng, L.M.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(2):808-815 Feb, 2022
Academic Journal
Okuno, J.; Kunihiro, T.; Konishi, K.; Materano, M.; Ali, T.; Kuehnel, K.; Seidel, K.; Mikolajick, T.; Schroeder, U.; Tsukamoto, M.; Umebayashi, T.
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 10:29-34 2022
Academic Journal
Okuno, J.; Kunihiro, T.; Konishi, K.; Shuto, Y.; Sugaya, F.; Materano, M.; Ali, T.; Lederer, M.; Kuehnel, K.; Seidel, K.; Mikolajick, T.; Schroeder, U.; Tsukamoto, M.; Umebayashi, T.
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 10:778-783 2022
Conference
Pirro, L.; Jayakumar, A.; Zimmerhackl, O.; Lipp, D.; Illgen, R.; Muehlhoff, A.; Pfuetzner, R.; Zaka, A.; Otto, M.; Hoentschel, J.; Raffel, Y.; Seidel, K.; Olivo, R.
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-4 Mar, 2021
Academic Journal
Purwins, D.; Fahsold, A.; Klas, T.; Albers, B.; Holle, B.; Quasdorf, T.; Berthold, H.; Seidel, K.; Haberstroh, J.
In: BMJ Open . (BMJ Open, 23 August 2023, 13(8))
Academic Journal
Silva, J.P.B.; Alcala, R.; Lancaster, S.; Lomenzo, P.D.; Mikolajick, T.; Slesazeck, S.; Schroeder, U.; Avci, U.E.; Chang, S.-C.; Karpov, I.V.; Barrett, N.; Bégon-Lours, L.; Borg, M.; Byun, S.; Hwang, C.S.; Kwon, T.; Park, M.H.; Ye, K.H.; Cheong, S.-W.; Huang, F.-T.; Choe, D.-H.; Heo, J.; Coignus, J.; Grenouillet, L.; Martin, S.; Deshpande, V.; Dubourdieu, C.; Dimoulas, A.; Fina, I.; Sánchez, F.; Funakubo, H.; Gruverman, A.; Hoffmann, M.; Hsain, H.A.; Jones, J.L.; Lee, Y.; Íñiguez, J.; Kersch, A.; Lederer, M.; Seidel, K.; Martin, L.W.; Salahuddin, S.; Migita, S.; Noheda, B.; Rabe, K.M.; Shimizu, T.; Shiraishi, T.; Toriumi, A.; Uchida, H.; Vilquin, B.; Xu, X.
In: APL Materials . (APL Materials, 1 August 2023, 11(8))
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[AR] Seidel, K.
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