학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 480건 | 목록 20~30
Conference
2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on. :199-204 Oct, 2012
Conference
2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on. :265-272 Oct, 2010
Conference
2010 East-West Design & Test Symposium (EWDTS) Design & Test Symposium (EWDTS), 2010 East-West. :17-20 Sep, 2010
Conference
2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW) Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2010 IEEE 16th International. :1-6 Jun, 2010
Academic Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 21(12):2286-2294 Dec, 2013
Academic Journal
IEEE Transactions on Emerging Topics in Computing IEEE Trans. Emerg. Topics Comput. Emerging Topics in Computing, IEEE Transactions on. 6(4):488-497 Jan, 2018
Conference
2006 IEEE Design and Diagnostics of Electronic Circuits and systems Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE. :166-171 2006
Conference
2006 Sixth IEEE Conference on Nanotechnology Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on. 1:258-261 2006
Conference
Proceedings of the Design Automation & Test in Europe Conference Design, Automation and Test in Europe Design, Automation and Test in Europe, 2006. DATE '06. Proceedings. 1:1-6 2006
Conference
23rd IEEE VLSI Test Symposium (VTS'05) VLSI test symposium VLSI Test Symposium, 2005. Proceedings. 23rd IEEE. :90-95 2005
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제한된 항목
[AR] Metra, C.
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