학술논문
'학술논문'
에서 검색결과 1,019건 | 목록
20~30
Conference
Alam, Md Nur K.; Thesberg, M.; Kaczer, B.; Roussel, Ph.; Vermeulen, B.; Truijen, B.; Popovici, M. I.; Ragnarsson, L.-A.; Verhulst, A. S.; Horiguchi, N.; Heyns, M.; Van Houdt, J.
2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2019 IEEE. :1-3 Oct, 2019
Academic Journal
Stuyck, N.D.; Li, R.; Kubicek, S.; Mohiyaddin, F.A.; Jussot, J.; Chan, B.T.; Simion, G.; Govoreanu, B.; Heyns, M.; Radu, I.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(8):1253-1256 Aug, 2020
Academic Journal
Gencarelli, F.; Vincent, B.; Souriau, L.; Richard, O.; Vandervorst, W.; Loo, R.; Caymax, M.; Heyns, M.
In Thin Solid Films 1 February 2012 520(8):3211-3215
Conference
Dumoulin Stuyck, N. I.; Li, R.; Godfrin, C.; Elsayed, A.; Kubicek, S.; Jussot, J.; Chan, B. T.; Mohiyaddin, F. A.; Shehata, M.; Simion, G.; Canvel, Y.; Goux, L.; Heyns, M.; Govoreanu, B.; Radu, I. P.
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Conference
Raymenants, E.; Wan, D.; Couet, S.; Canvel, Y.; Thiam, A.; Tsvetanova, D.; Souriau, L.; Asselberghs, I.; Carpenter, R.; Jossart, N.; Manfrini, M.; Vaysset, A.; Bultynck, O.; Van Beek, S.; Heyns, M.; Nikonov, D.E.; Young, I.A.; Ghosh, S.; Vila, L.; Garello, K.; Pizzini, S.; Nguyen, V.D.; Radu, I.P.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :32.3.1-32.3.4 Dec, 2021
Report
Verjauw, J.; Potočnik, A.; Mongillo, M.; Acharya, R.; Mohiyaddin, F.; Simion, G.; Pacco, A.; Ivanov, Ts.; Wan, D.; Vanleenhove, A.; Souriau, L.; Jussot, J.; Thiam, A.; Swerts, J.; Piao, X.; Couet, S.; Heyns, M.; Govoreanu, B.; Radu, I.
Phys. Rev. Applied 16, 014018 (2021)
Academic Journal
Lin, C.A.; Chiu, H.C.; Chiang, T.H.; Chang, Y.C.; Lin, T.D.; Kwo, J.; Wang, W.-E.; Dekoster, J.; Heyns, M.; Hong, M.
In Journal of Crystal Growth 15 May 2011 323(1):99-102
Academic Journal
Alian, A.; Brammertz, G.; Waldron, N.; Merckling, C.; Hellings, G.; Lin, H.C.; Wang, W.E.; Meuris, M.; Simoen, E.; Meyer, K. De; Heyns, M.
In Microelectronic Engineering 2011 88(2):155-158
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제한된 항목
[AR] Heyns, M.
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