학술논문
'학술논문'
에서 검색결과 255건 | 목록
20~30
Academic Journal
In: Molecular Systems Design and Engineering . (Molecular Systems Design and Engineering, December 2017, 2(5):567-580)
Academic Journal
Khaira, G.; Doxastakis, M.; Bowen, A.; Ren, J.; Suh, H.S.; Chen, X.; Zhou, C.; De Pablo, J.J.; Nealey, P.F.; Segal-Peretz, T.; Hannon, A.F.; Sunday, D.F.; Kline, R.J.; Ferrier, N.J.; Vishwanath, V.; Gronheid, R.
In: Macromolecules . (Macromolecules, 10 October 2017, 50(19):7783-7793)
Academic Journal
In: ACS Applied Materials and Interfaces . (ACS Applied Materials and Interfaces, 20 September 2017, 9(37):31325-31334)
Academic Journal
In: Materials Science in Semiconductor Processing . (Materials Science in Semiconductor Processing, 1 August 2017, 66:26-32)
Academic Journal
In: Journal of Micro/ Nanolithography, MEMS, and MOEMS . (Journal of Micro/ Nanolithography, MEMS, and MOEMS, 1 July 2017, 16(3))
Periodical
Adan, Ofer; Robinson, John C.; Gutman, N.; Tarshish, I.; Gronheid, R.; Dror, C.; Michelsson, D.; Backhauss, H.; Levin, L.; Levinski, V.; Paskover, Y.; Yerushalmi, L.; Heidrich, T.; Czerkas, S.; Pohlmann, U.; Laske, F.
Proceedings of SPIE; March 2020, Vol. 11325 Issue: 1 p113251X-113251X-7, 1019267p
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Photomask Technology 2022. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12293)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
Conference
Panneerchelvam, P.; Huard, C.M.; Pret, A.V.; Agarwal, A.; Mani, A.; Gronheid, R.; Demand, M.; Kumar, K.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
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제한된 항목
[AR] Gronheid, R.
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