학술논문
'학술논문'
에서 검색결과 56건 | 목록
20~30
Academic Journal
In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures . (Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, November 2005, 23(6):3028-3032)
Academic Journal
In: International Journal of Machine Tools and Manufacture . (International Journal of Machine Tools and Manufacture, May/June 1998, 38(5-6):417-418)
Academic Journal
Cresswell, M.W.; Ghoshtagore, R.N.; Allen, R.A.; Guthrie, W.F.; Linholm, L.W.; Dixson, R.G.; Teague, E.C.; Sniegowski, J.J.; Gurnell, A.W.
In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers . (Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, December 1996, 35 12 SUPPL. B:6597-6609)
Academic Journal
In: Astrophysical Journal . (Astrophysical Journal, 10 March 1993, 405(2):801-802)
Academic Journal
In: Physical Review A . (Physical Review A, 1989, 40(7):3626-3631)
Academic Journal
In Computer Standards & Interfaces 1999 21(2):190-190
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering . (Proceedings of SPIE - The International Society for Optical Engineering, 2014, 9173)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2012, 8324)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2012, 8324)
Conference
In: AIP Conference Proceedings , Frontiers of Characterization and Metrology for Nanoelectronics: 2011. (AIP Conference Proceedings, 2011, 1395:309-313)
검색 결과 제한하기
제한된 항목
[AR] Dixson, R.G.
발행연도 제한
-
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