학술논문
'학술논문'
에서 검색결과 30건 | 목록
20~30
Conference
Fleury, Dominique; Cros, Antoine; Romanjek, Krunoslav; Roy, David; Perrier, Franck; Dumont, Benjamin; Brut, Hugues
2007 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on. :89-92 Mar, 2007
Conference
Cros, Antoine; Romanjek, Krunoslav; Fleury, Dominique; Harrison, Samuel; Cerutti, Robin; Coronel, Philippe; Dumont, Benjamin; Pouydebasque, Arnaud; Wacquez, Romain; Duriez, Blandine; Gwoziecki, Romain; Boeuf, Frederic; Brut, Hugues; Ghibaudo, Gerard; Skotnicki, Thomas
2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006
Conference
2012 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on. :23-24 Mar, 2012
Academic Journal
Shin, Minju; Shi, Ming; Mouis, Mireille; Cros, Antoine; Josse, Emmanuel; Mukhopadhyay, Sutirtha; Piot, Benjamin; Kim, Gyu-Tae; Ghibaudo, Gerard
Comparaison des effets de canaux courts entre les technologies MOSFET FDSOI et MOSFET bulk. (French)
Academic Journal
J3eA; 2015, Vol. 14, p1-7, 7p
Academic Journal
Fleury, Dominique; Cros, Antoine; Romanjek, Krunoslav; Roy, David; Perrier, Franck; Dumont, Benjamin; Brut, Hugues; Ghibaudo, Gerard
IEEE Transactions on Semiconductor Manufacturing. Nov, 2008, Vol. 21 Issue 4, p504, 9 p.
Academic Journal
Minju Shin; Ming Shi; Mouis, Mireille; Cros, Antoine; Josse, Emmanuel; Gyu-Tae Kim; Ghibaudo, Gérard
Academic Journal
IEEE Electron Device Letters; Sep2009, Vol. 30 Issue 9, p975-977, 3p, 1 Chart, 4 Graphs
Academic Journal
Hofheinz, Max; Jehl, Xavier; Sanquer, Marc; Cerutti, Robin; Cros, Antoine; Coronel, Philippe; Brut, Hugues; Skotnicki, Thomas
Academic Journal
검색 결과 제한하기
제한된 항목
[AR] Cros, Antoine
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