학술논문

발행년
-
(예 : 2010-2015)
'학술논문' 에서 검색결과 418건 | 목록 190~200
Conference
In: Proceedings of the IEEE VLSI Test Symposium, 2019 IEEE 37th VLSI Test Symposium, VTS 2019. (Proceedings of the IEEE VLSI Test Symposium, April 2019, 2019-April)
Book
In: Machine Learning in VLSI Computer-Aided Design. (Machine Learning in VLSI Computer-Aided Design, 1 January 2019, :119-173)
Conference
Proceedings of the IEEE 1999 Custom Integrated Circuits Conference (Cat No99CH36327); 1999, p159-162, 4p
Conference
Design, Automation & Test in Europe Conference & Exhibition, 1999 Proceedings (Cat No PR00078); 1999, p283-288, 6p
Conference
Proceedings 1999 IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems (EFT'99); 1999, p339-347, 9p
Conference
In: 2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2018, 2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2018. (2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2018, 12 September 2018, :229-236)
Conference
In: Proceedings - International Test Conference, International Test Conference 2018, ITC 2018 - Proceedings. (Proceedings - International Test Conference, 2 July 2018, 2018-October)
Conference
In: Proceedings - International Test Conference, International Test Conference 2018, ITC 2018 - Proceedings. (Proceedings - International Test Conference, 2 July 2018, 2018-October)
Academic Journal
In: Journal of Electronic Testing: Theory and Applications (JETTA). (Journal of Electronic Testing: Theory and Applications (JETTA), 1998, 13(2):105-120)
Conference
In: Proceedings of the IEEE VLSI Test Symposium, Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. (Proceedings of the IEEE VLSI Test Symposium, 29 May 2018, 2018-April:1)
검색 결과 제한하기
제한된 항목
[AR] Makris, Y.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어