학술논문
'학술논문'
에서 검색결과 420건 | 목록
190~200
Academic Journal
In: Journal of the Electrochemical Society . (Journal of the Electrochemical Society, March 2002, 149(3):G194-G197)
Academic Journal
In: Journal of Applied Physics . (Journal of Applied Physics, 1 April 2001, 89(7):3811-3820)
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, July 2001, 41(7):1053-1056)
Conference
Caruso, E.; Lin, J.; Monaghan, S.; Cherkaoui, K.; Floyd, L.; Gity, F.; Hurley, P.K.; Palestri, P.; Esseni, D.; Selmi, L.
In: International Conference on Simulation of Semiconductor Processes and Devices, SISPAD , Proceedings of 2019 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2019. (International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, September 2019, 2019-September)
Academic Journal
Kelly, P.V.; Mooney, M.B.; Beechinor, J.T.; O'Sullivan, B.J.; Hurley, P.K.; Crean, G.M.; Zhang, J.-Y.; Boyd, I.W.; Paillous, M.; Jimenez, C.; Senateur, J.-P.
In: Advanced Materials for Optics and Electronics . (Advanced Materials for Optics and Electronics, May 2000, 10(3-5):115-122)
Academic Journal
Academic Journal
Djara, V.; O’Regan, T.P.; Cherkaoui, K.; Schmidt, M.; Monaghan, S.; O’Connor, É.; Povey, I.M.; O’Connell, D.; Pemble, M.E.; Hurley, P.K.
Academic Journal
Academic Journal
In: Microelectronics Reliability , Dielectrics in Microelectronics. (Microelectronics Reliability, 2000, 40(4-5):645-648)
Conference
1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat No99TH8395); 1999, p45-48, 4p
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제한된 항목
[AR] Hurley, P.K.
발행연도 제한
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