학술논문
'학술논문'
에서 검색결과 106건 | 목록
10~20
Conference
Na, M.H.; Jang, D.; Baert, R.; Sarkar, S.; Patli, S.; Zografos, O.; Chehab, B.; Spessot, A.; Sisto, G.; Schuddinck, P.; Mertens, H.; Oniki, Y.; Hellings, G.; Litta, E. Dentoni; Ryckaert, J.; Horiguchi, N.
2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2021 5th IEEE. :1-3 Apr, 2021
Conference
Chen, R.; Lofrano, M.; Mirabelli, G.; Sisto, G.; Yang, S.; Jourdain, A.; Schleicher, F.; Veloso, A.; Zografos, O.; Weckx, P.; Hiblot, G.; Plas, G. Van der; Hellings, G.; Ryckaert, J.; Beyne, E.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :23.4.1-23.4.4 Dec, 2022
Conference
Chen, R.; Sisto, G.; Stucchi, M.; Jourdain, A.; Miyaguchi, K.; Schuddinck, P.; Woeltgens, P.; Lin, H.; Kakarla, N.; Veloso, A.; Milojevic, D.; Zografos, O.; Weckx, P.; Hellings, G.; Van Der Plas, G.; Ryckaert, J.; Beyne, E.
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :429-430 Jun, 2022
Conference
Ryckaert, J.; Chehab, B.; Jang, D.; Mirabelli, G.; Salahuddin, S.M.; Schuddinck, P.; Zografos, O.; Zubair, A.; Weckx, Pieter; Hellings, Geert
2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) VLSI Technology, Systems and Applications (VLSI-TSA), 2021 International Symposium on. :1-2 Apr, 2021
Conference
Gilardi, C.; Chehab, B.; Sisto, G.; Schuddinck, P.; Ahmed, Z.; Zografos, O.; Lin, Q.; Hellings, G.; Ryckaert, J.; Wong, H.-S.P.; Mitra, S.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :27.3.1-27.3.4 Dec, 2021
Conference
Ciubotaru, F.; Zografos, O.; Talmelli, G.; Adelmann, C.; Radu, I. P.; Fischer, T.; Chumak, A.; Pirro, P.; Hillebrands, B.; Devolder, T.
2017 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2017 IEEE International. :1-4 May, 2017
Conference
Zografos, O.; De Meester, A.; Testa, E.; Soeken, M.; Gaillardon, P.-E.; De Micheli, G.; Amaru, L.; Raghavan, P.; Catthoor, F.; Lauwereins, R.
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017. :1306-1311 Mar, 2017
Conference
Ryckaert, J.; Na, M. H.; Weckx, P.; Jang, D.; Schuddinck, P.; Chehab, B.; Patli, S.; Sarkar, S.; Zografos, O.; Baert, R.; Verkest, D.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :29.4.1-29.4.4 Dec, 2019
Conference
Schuddinck, P.; Zografos, O.; Weckx, P.; Matagne, P.; Sarkar, S.; Sherazi, Y.; Baert, R.; Jang, D.; Yakimets, D.; Gupta, A.; Parvais, B.; Ryckaert, J.; Verkest, D.; Mocuta, A.
2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T204-T205 Jun, 2019
Conference
Mishra, S.; Vermeersch, B.; Sankatali, V.; Kukner, H.; Mirabelli, G.; Bufler, F.M.; Brunion, M.; Abdi, D.; Oprins, H.; Biswas, D.; Zografos, O.; Catthoor, F.; Weckx, P.; Hellings, G.; Myers, J.; Ryckaert, J.
In: Digest of Technical Papers - Symposium on VLSI Technology , 2024 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2024. (Digest of Technical Papers - Symposium on VLSI Technology, 2024)
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[AR] Zografos, O.
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