학술논문
'학술논문'
에서 검색결과 130건 | 목록
10~20
Conference
18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the. :1-5 Jul, 2011
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 11(1):131-140 Mar, 2011
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 57(11):2892-2901 Nov, 2010
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 10(1):18-25 Mar, 2010
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 10(1):108-115 Mar, 2010
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 9(2):222-230 Jun, 2009
Academic Journal
Djezzar, B.; Benabdelmoumene, A.; Zatout, B.; Messaoud, D.; Chenouf, A.; Tahi, H.; Boubaaya, M.; Timlelt, H.
In: Microelectronics Reliability . (Microelectronics Reliability, July 2020, 110)
Academic Journal
In: International Journal of Electronics Letters . (International Journal of Electronics Letters, 2020, 8(4):355-369)
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 17(1):99-105 Mar, 2017
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 16(3):290-297 Sep, 2016
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제한된 항목
[AR] Tahi, H.
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