학술논문
'학술논문'
에서 검색결과 645건 | 목록
10~20
Academic Journal
IEEE Transactions on Emerging Topics in Computing IEEE Trans. Emerg. Topics Comput. Emerging Topics in Computing, IEEE Transactions on. 9(2):680-691 Jun, 2021
Academic Journal
Hapke, F.; Howell, W.; Maxwell, P.; Brazil, E.; Venkataraman, S.; Dutta, R.; Glowatz, A.; Fast, A.; Rajski, J.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 40(3):584-597 Mar, 2021
Academic Journal
Mukherjee, N.; Tille, D.; Sapati, M.; Liu, Y.; Mayer, J.; Milewski, S.; Moghaddam, E.; Rajski, J.; Solecki, J.; Tyszer, J.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 29(1):76-88 Jan, 2021
Academic Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 39(10):2964-2975 Oct, 2020
Academic Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 39(8):1699-1710 Aug, 2020
Academic Journal
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 37(4):21-26 Aug, 2020
Conference
Howell, W.; Hapke, F.; Brazil, E.; Venkataraman, S.; Datta, R.; Glowatz, A.; Redemund, W.; Schmerberg, J.; Fast, A.; Rajski, J.
2018 IEEE International Test Conference (ITC) International Test Conference (ITC), 2018 IEEE. :1-10 Oct, 2018
Academic Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 38(6):1028-1041 Jun, 2019
Academic Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 25(3):1112-1125 Mar, 2017
Conference
2014 International Test Conference Test Conference (ITC), 2014 IEEE International. :1-7 Oct, 2014
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제한된 항목
[AR] Rajski, J.
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