학술논문
'학술논문'
에서 검색결과 38건 | 목록
10~20
Academic Journal
Basistyy, R.; Stanislavchuk, T. N.; Sirenko, A. A.; Litvinchuk, A. R; Kotelyanskii, M.; Carr, G. L.; Lee, N.; Wang, X.; Cheong, S.-W.
Conference
In: ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings , 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2019. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, May 2019, 2019-May)
Academic Journal
Rogers, P. D.; Choi, Y. J.; Standard, E. C.; Kang, T. D.; Ahn, K. H.; Dubroka, A.; Marsik, P.; Wang, Ch.; Bernhard, C.; Park, S.; Cheong, S.-W.; Kotelyanskii, M.; Sirenko, A. A.
Academic Journal
Polymer Science -- Series A; May2008, Vol. 50 Issue 5, p494-506, 13p
Academic Journal
In: Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics . (Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics, 1998, 58(1):R12-R15)
Academic Journal
In: Physical Review Letters . (Physical Review Letters, 1998, 80(6):1252-1255)
Academic Journal
In: Macromolecules . (Macromolecules, 1 January 1996, 29(26):8497-8506)
Academic Journal
Stanislavchuk, T. N.; Kang, T. D.; Rogers, P. D.; Standard, E. C.; Basistyy, R.; Kotelyanskii, A. M.; Nita, G.; Zhou, T.; Carr, G. L.; Kotelyanskii, M.; Sirenko, A. A.
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXII. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 6922)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXII. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 6922)
검색 결과 제한하기
제한된 항목
[AR] Kotelyanskii, M.
발행연도 제한
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