학술논문
'학술논문'
에서 검색결과 27건 | 목록
10~20
Conference
Aoki, Riho; Katayama, Shogo; Sasaki, Yuto; Machida, Kosuke; Nakatani, Takayuki; Wang, Jianlong; Kuwana, Anna; Hatayama, Kazumi; Kobayashi, Haruo; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu
2019 IEEE 13th International Conference on ASIC (ASICON) ASIC (ASICON), 2019 IEEE 13th International Conference on. :1-4 Oct, 2019
Conference
Wei, Jiang-Lin; Kushita, Nene; Arai, Takahiro; Sha, Lei; Kuwana, Anna; Kobayashi, Haruo; Nakatani, Takayuki; Hatayama, Kazumi; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu
2019 IEEE 13th International Conference on ASIC (ASICON) ASIC (ASICON), 2019 IEEE 13th International Conference on. :1-4 Oct, 2019
Conference
Sasaki, Yuto; Machida, Kosuke; Aoki, Riho; Katayama, Shogo; Nakatani, Takayuki; Wang, Jianlong; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Kuwana, Anna; Hatayama, Kazumi; Kobayashi, Haruo
2019 IEEE International Test Conference in Asia (ITC-Asia) ITC-ASIA Test Conference in Asia (ITC-Asia), 2019 IEEE International. :1-6 Sep, 2019
Conference
Mangelsdorf, Chris; Madhvaraj, Manasa; Mir, Salvador; Barragan, Manuel; Iimori, Daisuke; Nakatani, Takayuki; Katayama, Shogo; Ogihara, Gaku; Zhao, Yujie; Wei, Jianglin; Kuwana, Anna; Katoh, Kentaroh; Hatayama, Kazumi; Kobayashi, Haruo; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu
2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-1 Apr, 2022
Conference
Sato, Keno; Nakatani, Takayuki; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Katayama, Shogo; Ogihara, Gaku; Iimori, Daisuke; Zhao, Yujie; Wei, Jianglin; Kuwana, Anna; Hatayama, Kazumi; Kobayashi, Haruo
2021 IEEE 30th Asian Test Symposium (ATS) ATS Asian Test Symposium (ATS), 2021 IEEE 30th. :139-140 Nov, 2021
Conference
Sato, Keno; Nakatani, Takayuki; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Kuwana, Anna; Hatayama, Kazumi; Kobayashi, Haruo
2020 IEEE 29th Asian Test Symposium (ATS) Asian Test Symposium (ATS), 2020 IEEE 29th. :1-2 Nov, 2020
Conference
Asada, Yusuke; Shimizu, Takahiko; Gendai, Yuji; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Wei, Jiang-Lin; Kushita, Nene; Arai, Hirotaka; Kuwana, Anna; Nakatani, Takayuki; Hatayama, Kazumi; Kobayashi, Haruo
2019 IEEE 37th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2019 IEEE 37th. :1-1 Apr, 2019
Academic Journal
Yamamoto, Shuhei; Sasaki, Yuto; Zhao, Yujie; Kuwana, Anna; Katoh, Kentaroh; Zhang, Zheming; Wei, Jianglin; Tran, Tri Minh; Katayama, Shogo; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Nakatani, Takayuki; Hatayama, Kazumi; Kobayashi, Haruo
IEEE Transactions on Device & Materials Reliability; Jun2022, Vol. 22 Issue 2, p142-153, 12p
Academic Journal
Zhao, Yujie; Katoh, Kentaroh; Kuwana, Anna; Katayama, Shogo; Wei, Jianglin; Kobayashi, Haruo; Nakatani, Takayuki; Hatayama, Kazumi; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu
Academic Journal
Katayama, Shogo; Nakatani, Takayuki; Iimori, Daisuke; Takagi, Misaki; Zhao, Yujie; Kuwana, Anna; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Katoh, Kentaroh; Hatayama, Kazumi; Kobayashi, Haruo
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[AR] Ichikawa, Tamotsu
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