학술논문
'학술논문'
에서 검색결과 85건 | 목록
10~20
Conference
Tokei, Zs.; Vega, V.; Murdoch, G.; O'Toole, M.; Croes, K.; Baert, R.; Veen, M. Van der; Adelmann, C.; Soulie, J. P.; Boemmels, J.; Wilson, C.; Park, S. H.; Sankaran, K.; Pourtois, G.; Sweerts, J.; Paolillo, S.; Decoster, S.; Mao, M.; Lazzarino, F.; Versluijs, J.; Blanco, V.; Ercken, M.; Kesters, E.; Le, Q-T.; Holsteyns, F.; Heylen, N.; Teugels, L.; Devriendt, K.; Struyf, H.; Morin, P.; Jourdan, N.; Elshocht, S. Van; Ciofi, I.; Gupta, A.; Zahedmanesh, H.; Vanstreels, K.; Na, M. H.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :32.2.1-32.2.4 Dec, 2020
Conference
Gupta, A.; Pedreira, O. Varela; Tao, Z.; Mertens, H.; Radisic, D.; Jourdan, N.; Devriendt, K.; Heylen, N.; Wang, S.; Chehab, B.; Jang, D.; Hellings, G.; Sebaai, F.; Lorant, C.; Teugels, L.; Peter, A.; Chan, BT; Schleicher, F.; Demonie, I.; Marien, P.; Sepulveda, A.; Richard, O.; Nagesh, N.; Lesniewska, A.; Lazzarino, F.; Ryckaert, J.; Morin, P.; Altamirano-Sanchez, E.; Murdoch, G.; Bommels, J.; Demuynck, S.; Na, M. H; Tokei, Z.; Biesemans, S.; Litta, E. Dentoni; Horiguchi, N.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :20.3.1-20.3.4 Dec, 2020
Conference
Vega-Gonzalez, V.; Puliyalil, H.; Versluijs, J.; Lesniewska, A.; Varela-Pereira, O.; Baert, R.; Paolillo, S.; Decoster, S.; Schleicher, F.; Montero, D.; Bekaert, J.; Kesters, E.; Le, Q. T.; Lorant, C.; Teugels, L.; Heylen, N.; Jourdan, N.; El-Mekki, Z.; van der Veen, M.; Ciofi, I.; Briggs, B.; Heijlen, J.; Dupas, L.; De-Wachter, B.; Vancoille, E.; Webers, T.; Vats, H.; Rynders, L.; Cupak, M.; Uk-Lee, J.; Drissi, Y.; Halipre, L.; Charley, A.-L.; Verdonck, P.; Witters, T.; Gompel, S. V.; Kimura, Y.; Demonie, I.; Lazzarino, F.; Ercken, M; Kim, R.; Trivkovic, D.; Croes, K.; Leray, P.; Jaysankar, M.; Wilson., C.; Muroch, G.; Tokei, Z.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :20.5.1-20.5.4 Dec, 2020
Academic Journal
Sinapi, F.; Heylen, N.; Travaly, Y.; Vereecke, G.; Baklanov, M.; Kesters, E.; Van Hoeymissen, J.; Hernandèz, J.L.; Beyer, G.; Fischer, P.
In Microelectronic Engineering 2007 84(11):2620-2623
Conference
Derakhshandeh, J.; De Preter, I.; Gerets, C.; Hou, L.; Heylen, N.; Beyne, E.; Beyer, G.; Slabbekoorn, J.; Dubey, V.; Jourdain, A.; Potoms, G.; Inoue, F.; Jamieson, G.; Vandersmissen, K.; Suhard, S.; Webers, T.; Capuz, G.; Wang, T.; Rebibis, K.J.; Miller, A.
2016 IEEE 66th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2016 IEEE 66th. :128-133 May, 2016
Conference
Velenis, D.; Van Huylenbroeck, S.; Heylen, N.; Vandersmissen, K.; Jourdain, A.; Miller, A.; Beyne, E.
2016 IEEE 66th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2016 IEEE 66th. :295-301 May, 2016
Conference
Briggs, B.; Wilson, C. J.; Devriendt, K.; van der Veen, M. H.; Decoster, S.; Paolillo, S.; Versluijs, J.; Kesters, E.; Sebaai, F.; Jourdan, N.; El-Mekki, Z.; Heylen, N.; Verdonck, P.; Wan, Danny; Pedreira, O. Varela; Croes, K.; Dutta, S.; Ryckaert, J.; Mallik, A.; Lariviere, S.; Bommels, J.; Tokei, Zs.
2017 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2017 IEEE International. :1-3 May, 2017
Conference
Vega-Gonzalez, V.; Wilson, C. J.; Briggs, B.; Decoster, S.; Versluijs, J.; Lesniewska, A.; Paolillo, S.; Baert, R.; Puliyalil, H.; Bekaert, J.; Kesters, E.; Le, Q. T.; Lorant, C.; Varela P., O.; Teugels, L.; Heylen, N.; El-Mekki, Z.; van der Veen, M.; Webers, T.; Vats, H.; Rynders, L.; Cupak, M.; Uk-Lee, J.; Drissi, Y.; Halipre, L.; Charley, A.-L.; Verdonck, P.; Witters, T.; Gompel, S. V.; Kimura, Y.; Jourdan, N.; Ciofi, I.; Gupta, A.; Contino, A.; Boccardi, G.; Lariviere, S.; Dupas, L.; De-Wachter, B.; Vancoille, E.; Lazzarino, F.; Ercken, M; Debacker, P.; Kim, R.; Trivkovic, D.; Croes, K.; Leray, P.; Dillemans, L.; Chen, Y.-F.; Tokei, Z.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :19.3.1-19.3.4 Dec, 2019
Conference
Vandooren, A.; Wu, Z.; Khaled, A.; Franco, J.; Parvais, B.; Li, W.; Witters, L.; Walke, A.; Peng, L.; Rassoul, N.; Matagne, P.; Debruyn, H.; Jamieson, G.; Inoue, F.; Devriendt, K.; Teugels, L.; Heylen, N.; Vecchio, E.; Zheng, T.; Radisic, D.; Rosseel, E.; Vanherle, W.; Hikavyy, A.; Chan, B. T.; Besnard, G.; Schwarzenbach, W.; Gaudin, G.; Radu, I.; Nguyen, B.-Y.; Waldron, N.; De Heyn, V.; Demuynck, S.; Boemmels, J.; Ryckaert, J.; Collaert, N.; Mocuta, D.
2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T56-T57 Jun, 2019
Conference
Vandersmissen, Kevin; Inoue, F.; Velenis, D.; Li, Y.; Dictus, D.; Frees, B.; Van Huylenbroeck, S.; Kondo, M.; Seino, T.; Heylen, N.; Struyf, H.; van der Veen, M. H.
2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM) Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 2015 IEEE International. :197-200 May, 2015
검색 결과 제한하기
제한된 항목
[AR] Heylen, N.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어