학술논문
'학술논문'
에서 검색결과 233건 | 목록
10~20
Conference
Proceedings. IEEE Lester Eastman Conference on High Performance Devices, 2004. High Performance Devices High Performance Devices, 2004. Proceedings. IEEE Lester Eastman Conference on. :167-172 2004
Conference
Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003 Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2003. IPFA 2003. Proceedings of the 10th International Symposium on the. :164-167 2003
Conference
16th International Conference on VLSI Design, 2003. Proceedings. VLSI design VLSI Design, 2003. Proceedings. 16th International Conference on. :223-226 2003
Conference
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. Reliability physics symposium Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International. :518-522 2003
Conference
Yang, B.; Ye, P.D.; Kwo, J.; Frei, M.R.; Gossmann, H.-J.L.; Mannaerts, J.P.; Sergent, M.; Hong, M.; Ng, K.K.; Bude, J.
24th Annual Technical Digest Gallium Arsenide Integrated Circuit (GaAs IC) Symposiu Gallium arsenide integrated circuit symposium Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2002. 24th Annual Technical Digest. :139-142 2002
Conference
32nd European Solid-State Device Research Conference Solid-State Device Research Conference, 2002. Proceeding of the 32nd European. :351-354 2002
Conference
De Blauwe, J.; Ostraat, M.; Green, M.L.; Weber, G.; Sorsch, T.; Kerber, A.; Klemens, F.; Cirelli, R.; Ferry, E.; Grazul, J.L.; Baumann, F.; Kim, Y.; Mansfield, W.; Bude, J.; Lee, J.T.C.; Hillenius, S.J.; Flagan, R.C.; Atwater, H.A.
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :683-686 2000
Conference
2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) Reliability physics Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International. :21-26 2000
Conference
Timp, G.; Bude, J.; Bourdelle, K.K.; Garno, J.; Ghetti, A.; Gossmann, H.; Green, M.; Forsyth, G.; Kim, Y.; Kleiman, R.; Klemens, F.; Kornblit, A.; Lochstampfor, C.; Mansfield, W.; Moccio, S.; Sorsch, T.; Tennant, D.M.; Timp, W.; Tung, R.
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :55-58 1999
Conference
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :449-452 1999
검색 결과 제한하기
제한된 항목
[AR] Bude, J.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어