학술논문
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Academic Journal
영미문학연구 / Journal of English Studies in Korea. Jun 15, 2023 44:55
Conference
Chang, S.-W.; Lu, T.-H.; Yang, C.-Y.; Yeh, C.-J.; Huang, M.-K.; Meng, C.-F.; Chen, P.-J.; Chang, T.-H.; Chang, Y.-S.; Jhu, J.-W.; Hong, T.-Z.; Ke, C.-C.; Yu, X.-R.; Lu, W.-H.; Baig, M. A.; Cho, T.-C.; Sung, P.-J.; Su, C.-J.; Hsueh, F.-K.; Chen, B.-Y.; Hu, H.-H.; Wu, C.-T.; Lin, K.-L.; Ma, W. C.-Y.; Lu, D.-D.; Kao, K.-H.; Lee, Y.-J.; Lin, C.-L.; Huang, K.-P.; Chen, K.-M.; Li, Y.; Samukawa, S.; Chao, T.-S.; Huang, G.-W.; Wu, W.-F.; Lee, W.-H.; Li, J.-Y.; Shieh, J.-M.; Tarng, J.-H.; Wang, Y.-H.; Yeh, W.-K.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :34.4.1-34.4.4 Dec, 2021
Academic Journal
Academic Journal
In Microelectronics Reliability November 2023 150
Conference
Rea-Rios, H. B.; Vazquez, G.; Sosa, J. M.; Juarez-Balderas, M. A.; Martinez-Rodriguez, P. R.; Langarica, D.
2022 IEEE International Autumn Meeting on Power, Electronics and Computing (ROPEC) Power, Electronics and Computing (ROPEC), 2022 IEEE International Autumn Meeting on. 6:1-6 Nov, 2022
Lg = 60 nm In0.53 Ga0.47 As MBCFETs: From gm_max = 13.7 mS/üm and Q = 180 to virtual-source modeling
Conference
Yoo, J.-H.; Jo, H.-B.; Lee, I.-G.; Choi, S.-M.; Baek, J.-M.; Lee, S T.; Jang, H.; Kong, M W.; Kim, H H.; Lee, H J.; Kim, H.-J.; Jeong, H.-S.; Park, W.-S.; Ko, D H.; Shin, S. H.; Kwon, H.-M.; Kim, S K.; Kim, J G.; Yun, J.; Kim, T.; Shin, K.-Y.; Kim, T.-W.; Shin, J.-K.; Lee, J.-H.; Shin, C.-S.; Seo, K.-S.; Kim, D.-H.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Conference
2018 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2018 IEEE. :698-702 Mar, 2018
Academic Journal
Academic Journal
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제한된 항목
[검색어] GATES, J. M.
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