학술논문
'학술논문'
에서 검색결과 504건 | 목록
170~180
Conference
In: Proceedings of the 2022 Conference on Empirical Methods in Natural Language Processing, EMNLP 2022 , Proceedings of the 2022 Conference on Empirical Methods in Natural Language Processing, EMNLP 2022. (Proceedings of the 2022 Conference on Empirical Methods in Natural Language Processing, EMNLP 2022, 2022, :3849-3862)
Conference
In: IWAPS 2022 - 2022 6th International Workshop on Advanced Patterning Solutions , IWAPS 2022 - 2022 6th International Workshop on Advanced Patterning Solutions. (IWAPS 2022 - 2022 6th International Workshop on Advanced Patterning Solutions, 2022)
Conference
In: IWAPS 2022 - 2022 6th International Workshop on Advanced Patterning Solutions , IWAPS 2022 - 2022 6th International Workshop on Advanced Patterning Solutions. (IWAPS 2022 - 2022 6th International Workshop on Advanced Patterning Solutions, 2022)
Frequency doubling and resolution enhancement technique exploration for chrome-less phase shift mask
Conference
In: IWAPS 2022 - 2022 6th International Workshop on Advanced Patterning Solutions , IWAPS 2022 - 2022 6th International Workshop on Advanced Patterning Solutions. (IWAPS 2022 - 2022 6th International Workshop on Advanced Patterning Solutions, 2022)
Conference
Chiu, C.-C.; Tian, F.; Feng, W.; Gao, M.; Lan, A.; Zhong, S.; Tsou, C.-J.; Zhu, N.; Zhu, J.; Pei, J.; Huang, K.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
Conference
Chiu, C.-C.; Tian, F.; Feng, W.; Gao, M.; Lan, A.; Tsou, C.-J.; Zhong, S.; Birnstein, N.; Zech, R.M.; Utzny, C.; Zhu, J.; Pei, J.; Huang, K.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
Conference
Chiu, C.-C.; Tian, F.; Feng, W.; Gao, M.; Lan, A.; Zhu, A.; Zhu, N.; Li, D.; Zhu, J.; Pei, J.; Huang, K.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
Book
In: Artificial Intelligence in Education - 23rd International Conference, AIED 2022, Proceedings . (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), 2022, 13355 LNCS:691-697)
Book
In: Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners’ and Doctoral Consortium - 23rd International Conference, AIED 2022, Proceedings . (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), 2022, 13356 LNCS:111-114)
Conference
Chiu, C.-C.; Gao, M.; Tian, F.; Feng, W.; Lan, A.; Li, D.; Zhong, S.; Zhu, A.; Zhu, N.; Xu, Y.; Zhu, J.; Pei, J.; Huang, K.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
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제한된 항목
[AR] Lan, A.
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