학술논문
'학술논문'
에서 검색결과 1,299건 | 목록
170~180
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 52(6):1132-1140 Jun, 2005
Academic Journal
In: Journal of Electronic Materials . (Journal of Electronic Materials, 1 August 2020, 49(8):4531-4536)
Academic Journal
Mooli, R.G.R.; Mukhi, D.; Watt, M.; Edmunds, L.; Xie, B.; Capooci, J.; Reslink, M.; Eze, C.; Mills, A.; Stolz, D.B.; Jurczak, M.; Ramakrishnan, S.K.
In: Metabolism: Clinical and Experimental . (Metabolism: Clinical and Experimental, June 2020, 107)
Academic Journal
Corrigan, J.K.; Ramachandran, D.; He, Y.; Palmer, C.J.; Banks, A.S.; Jurczak, M.J.; Chen, R.; Li, B.; Lantier, L.; McGuinness, O.P.; Friedline, R.H.; Kim, J.K.; Ramsey, J.J.; Croniger, C.; Adams, S.; Brunengraber, H.; Jurczak, M.; Kang, L.; Lloyd, K.; McIndoe, R.; Obici, S.; Shulman, J.; Warden, C.; Gettys, T.; Wasserman, D.; Knotts, T.A.; Kaiyala, K.
In: eLife . (eLife, May 2020, 9:1-34)
Academic Journal
Chen, Y. Y.; Degraeve, R.; Govoreanu, B.; Clima, S.; Goux, L.; Fantini, A.; Kar, G. S.; Wouters, D. J.; Groeseneken, G.; Jurczak, M.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 34(5):626-628 May, 2013
Modeling the Impact of Reset Depth on Vacancy-Induced Filament Perturbations in ${\rm HfO}_{2}$ RRAM
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 34(5):614-616 May, 2013
Academic Journal
Clima, S.; Kaczer, B.; Govoreanu, B.; Popovici, M.; Swerts, J.; Verhulst, A. S.; Jurczak, M.; De Gendt, S.; Pourtois, G.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 34(3):402-404 Mar, 2013
Academic Journal
Wu, Y.-H.; Wouters, D. J.; Hendrickx, P.; Zhang, L.; Chen, Y. Y.; Goux, L.; Fantini, A.; Groeseneken, G.; Jurczak, M.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 34(3):414-416 Mar, 2013
Conference
Fantini, A.; Gorine, G.; Degraeve, R.; Goux, L.; Chen, C. Y.; Redolfi, A.; Clima, S.; Cabrini, A.; Torelli, G.; Jurczak, M.
2015 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2015 IEEE International. :7.5.1-7.5.4 Dec, 2015
Conference
Chen, C. Y.; Fantini, A.; Goux, L.; Degraeve, R.; Clima, S.; Redolfi, A.; Groeseneken, G.; Jurczak, M.
2015 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2015 IEEE International. :10.6.1-10.6.4 Dec, 2015
검색 결과 제한하기
제한된 항목
[AR] Jurczak, M.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어