학술논문
'학술논문'
에서 검색결과 213건 | 목록
160~170
Academic Journal
In: Astrophysical Journal . (Astrophysical Journal, 1997, 486(1 PART II):L23-L26)
Academic Journal
In: Astrophysical Journal . (Astrophysical Journal, 20 October 1995, 452(2):L121-L123)
Academic Journal
Cottle, P.D.; Kennedy, M.A.; Kemper, K.W.; Brown, J.D.; Jacobsen, E.R.; Sharon, Y.Y.; Leitch, E.M.; Mabuchi, H.; Mao, Z.Q.; Slivka, T.; Greene, E.J.
In: Physical Review C . (Physical Review C, 1991, 44(4):1668-1671)
Conference
Crumrine, M.; Keating, B.G.; Lau, K.; Leitch, E.M.; Namikawa, T.; Pryke, C.; Schwarz, R.; Sheehy, C.D.; Tolan, J.E.; Vieregg, A.G.; Wiebe, D.V.; Willmert, J.; Wu, W.L.K.; Yang, E.; Ade, P.A.R.; Sudiwala, R.V.; Tucker, C.E.; Ahmed, Z.; Irwin, K.D.; Kuo, C.L.; Ogburn, R.W.; Thompson, K.L.; Yoon, K.W.; Aikin, R.W.; Bock, J.J.; Brevik, J.A.; Hui, H.; Kefeli, S.; Lueker, M.V.; Moncelsi, L.; O'Brient, R.; Schillaci, A.; Soliman, A.; Staniszewski, Z.K.; Steinbach, B.; Teply, G.P.; Wandui, A.; Zhang, C.; Alexander, K.D.; Barkats, D.; Bowens-Rubin, R.; Buder, I.; Buza, V.; Connors, J.; Cornelison, J.; Dierickx, M.; Karkare, K.S.; Kovac, J.M.; Racine, B.; Richter, S.; St Germaine, T.; Wong, C.L.; Benton, S.J.; Netterfield, C.B.; Bischoff, C.A.; Palladino, S.; Umiltà, C.; Crill, B.P.; Hildebrandt, S.R.; Megerian, K.G.; Nguyen, H.T.; Turner, A.D.; Weber, A.C.; Duband, L.; Bullock, E.; Dvorkin, C.; Filippini, J.P.; Fliescher, S.; Grayson, J.A.; Hall, G.; Halpern, M.; Harrison, S.A.; Hilton, G.C.; Kang, J.H.; Karpel, E.; Kaufman, J.P.; Kernasovskiy, S.A.; Larsen, N.A.
In: Proceedings of SPIE - The International Society for Optical Engineering , Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX. (Proceedings of SPIE - The International Society for Optical Engineering, 2018, 10708)
Conference
Hui, H.; Grayson, J.; Larsen, N.A.; Leitch, E.M.; Lueker, M.; Moncelsi, L.; Namikawa, T.; O'Brient, R.; Ogburn, R.W.; Schillaci, A.; Sheehy, C.D.; Soliman, A.; Staniszewski, Z.K.; Steinbach, B.; Teply, G.P.; Thompson, K.L.; Tolan, J.E.; Vieregg, A.G.; Wandui, A.; Wiebe, D.V.; Wu, W.L.K.; Zhang, C.; Ade, P.A.R.; Kefeli, S.; Kernasovskiy, S.A.; Kovac, J.M.; Kuo, C.-L.; Sudiwala, R.V.; Tucker, C.; Ahmed, Z.; Yang, E.; Yoon, K.W.; Alexander, K.D.; Barkats, D.; Bowens-Rubin, R.; Buder, I.; Buza, V.; Connors, J.; Dierickx, M.; Harrison, S.; Karkare, K.S.; Racine, B.; Richter, S.; St Germaine, T.; Wong, C.L.; Benton, S.J.; Netterfield, C.B.; Bischoff, C.A.; Palladino, S.; Umiltà, C.; Bullock, E.; Crumrine, M.; Fliescher, S.; Hall, G.; Lau, K.; Pryke, C.; Schwarz, R.; Willmert, J.; Crill, B.P.; Megerian, K.G.; Nguyen, H.T.; Turner, A.D.; Weber, A.C.; Duband, L.; Aikin, R.W.; Bock, J.J.; Brevik, J.A.; Cornelison, J.; Dvorkin, C.; Filippini, J.P.; Halpern, M.; Hildebrandt, S.R.; Hilton, G.C.; Irwin, K.D.; Kang, J.; Karpel, E.; Kaufman, J.P.; Keating, B.G.
In: Proceedings of SPIE - The International Society for Optical Engineering , Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX. (Proceedings of SPIE - The International Society for Optical Engineering, 2018, 10708)
Conference
Bender, A.N.; Bleem, L.S.; Hilton, G.C.; Korman, M.; Kuhlmann, S.; Kuo, C.-L.; Michalik, D.; Montgomery, J.; Nadolski, A.; Natoli, T.; Noble, G.I.; Novosad, V.; Pearson, J.; Posada, C.M.; Ruhl, J.E.; Sayre, J.T.; Story, K.T.; Thompson, K.L.; Vale, L.R.; Vanderlinde, K.; Vieira, J.D.; Wang, G.; Yefremenko, V.; Yoon, K.W.; Young, M.R.; Anderson, A.J.; Raghunathan, S.; Reichardt, C.L.; Smecher, G.; Stark, A.A.; Suzuki, A.; Tucker, C.; Whitehorn, N.; Ade, P.A.R.; Ahmed, Z.; Benson, B.A.; Jonas, M.; Kubik, D.L.; Ngyuen, H.; Rahlin, A.; Avva, J.S.; Cukierman, A.; De Haan, T.; Groh, J.C.; Harrington, N.L.; Holzapfel, W.L.; Huang, N.; Jeong, O.B.; Lee, A.T.; Aylor, K.; Knox, L.; Barry, P.S.; Basu Thakur, R.; Carlstrom, J.E.; Crawford, T.M.; Dutcher, D.; Gallicchio, J.; Leitch, E.M.; Lowitz, A.E.; Meyer, S.S.; Padin, S.; Pan, Z.; Quan, W.; Shirokoff, E.; Sobrin, J.A.; Wu, W.L.K.; Bocquet, S.; Cho, H.-M.; Byrum, K.; Carter, F.W.; Cecil, T.W.; Chang, C.L.; Cliche, J.F.; Denison, E.V.; Ding, J.; Dobbs, M.A.; Dodelson, S.; Everett, W.; Foster, A.; Gilbert, A.; Guns, S.T.; Halverson, N.W.; Harke-Hosemann, A.H.; Henning, J.W.; Holder, G.P.; Irwin, K.D.; Jones, A.; Khaire, T.S.; Kofman, A.M.
In: Proceedings of SPIE - The International Society for Optical Engineering , Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX. (Proceedings of SPIE - The International Society for Optical Engineering, 2018, 10708)
Conference
Soliman, A.; Aikin, R.W.; Bock, J.J.; Brevik, J.A.; Hildebrandt, S.R.; Hui, H.; Kefeli, S.; Lueker, M.; Moncelsi, L.; Brient, R.O.; Schillaci, A.; Staniszewski, Z.K.; Steinbach, B.; Teply, G.P.; Van Zyl, J.; Wandui, A.; Zhang, C.; Ade, P.A.R.; Sudiwala, R.; Tucker, C.; Wiebe, D.V.; Ahmed, Z.; Irwin, K.D.; Kuo, C.L.; Ogburn, R.W.; Thompson, K.L.; Yang, E.; Yoon, K.W.; Alexander, K.D.; Barkats, D.; Bowens-Rubin, R.; Buder, I.; Buza, V.; Connors, J.; Cornelison, J.; Dierickx, M.; Harrison, S.; Karkare, K.S.; Kovac, J.M.; Racine, B.; Richter, S.; St Germaine, T.; Wong, C.L.; Benton, S.J.; Netterfield, C.B.; Bischoff, C.A.; Umiltà, C.; Crill, B.P.; Megerian, K.G.; Nguyen, H.T.; Palladino, S.; Turner, A.D.; Weber, A.C.; Bullock, E.; Pryke, C.; Schwarz, R.; Willmert, J.; Dvorkin, C.; Crumrine, M.; Fliescher, S.; Hall, G.; Lau, K.; Grayson, J.A.; Kang, J.H.; Karpel, E.; Kernasovskiy, S.A.; Tolan, J.E.; Filippini, J.P.; Halpern, M.; Hilton, G.C.; Larsen, N.A.; Kaufman, J.P.; Keating, B.G.; Leitch, E.M.; Vieregg, A.G.; Wu, W.L.K.; Namikawa, T.; Sheehy, C.D.; Duband, L.
In: Proceedings of SPIE - The International Society for Optical Engineering , Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX. (Proceedings of SPIE - The International Society for Optical Engineering, 2018, 10708)
Conference
Kang, J.H.; Kernasovskiy, S.A.; Kuo, C.L.; Leitch, E.M.; Namikawa, T.; Netterfield, B.; Ogburn, R.W.; Sheehy, C.D.; Thompson, K.L.; Tolan, J.E.; Vieregg, A.G.; Wiebe, D.V.; Wu, W.L.K.; Yang, H.; Yoon, K.W.; Ade, P.A.R.; Sudiwala, R.V.; Tucker, C.; Ahmed, Z.; Aikin, R.W.; Bock, J.J.; Brevik, J.A.; Kefeli, S.; Lueker, M.; Moncelsi, L.; O'Brient, R.; Schillaci, A.; Soliman, A.; Staniszewski, Z.K.; Steinbach, B.; Teply, G.P.; Wandui, A.; Zhang, C.; Alexander, K.D.; Barkats, D.; Boenish, H.; Bowens-Rubin, R.; Buder, I.; Buza, V.; Connors, J.; Cornelison, J.; Dierickx, M.; Harrison, S.; Karkare, K.S.; Kovac, J.M.; Racine, B.; Richter, S.; St Germaine, T.; Wong, C.L.; Benton, S.J.; Bischoff, C.A.; Palladino, S.; Umiltà, C.; Bullock, E.; Crumrine, M.; Fliescher, S.; Hall, G.; Lau, K.; Pryke, C.; Schwarz, R.; Willmert, J.; Crill, B.P.; Megerian, K.G.; Nguyen, H.T.; Turner, A.D.; Weber, A.C.; Duband, L.; Dvorkin, C.; Filippini, J.P.; Grayson, J.A.; Halpern, M.; Hildebrandt, S.R.; Hilton, G.C.; Hui, H.; Karpel, E.; Irwin, K.D.; Kaufman, J.P.; Keating, B.G.; Larsen, N.A.
In: Proceedings of SPIE - The International Society for Optical Engineering , Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX. (Proceedings of SPIE - The International Society for Optical Engineering, 2018, 10708)
Conference
Barkats, D.; Buder, I.; Buza, V.; Cornelison, J.; Duband, L.; Karpel, E.; Kaufman, J.P.; Keating, B.G.; Kernasovskiy, S.A.; Kuo, C.L.; Larsen, N.A.; Leitch, E.M.; Namikawa, T.; Ogburn, R.W.; Racine, B.; Richter, S.; Sheehy, C.D.; St Germaine, T.; Thompson, K.L.; Tolan, J.E.; Vieregg, A.G.; Wandui, A.; Wiebe, D.V.; Wong, C.L.; Wu, W.L.K.; Yang, H.; Yoon, K.W.; Pentacoff, C.; Ade, P.A.R.; Sudiwala, R.V.; Tucker, C.; Ahmed, Z.; Aikin, R.W.; Bock, J.J.; Brevik, J.A.; Hildebrandt, S.R.; Hui, H.; Kefeli, S.; Lueker, M.; Moncelsi, L.; O'Brient, R.; Schillaci, A.; Soliman, A.; Staniszewski, Z.K.; Steinbach, B.; Teply, G.P.; Zhang, C.; Benton, S.J.; Bischoff, C.A.; Palladino, S.; Umiltà, C.; Bullock, E.; Crumrine, M.; Fliescher, S.; Hall, G.; Lau, K.; Pryke, C.; Schwarz, R.; Willmert, J.; Crill, B.P.; Megerian, K.G.; Nguyen, H.T.; Turner, A.D.; Weber, A.C.; Dierickx, M.I.; Kovac, J.M.; Alexander, K.D.; Bowens-Rubin, R.; Connors, J.; Dvorkin, C.; Filippini, J.P.; Grayson, J.A.; Halpern, M.; Harrison, S.A.; Hilton, G.C.; Irwin, K.D.; Kang, J.; Karkare, K.S.
In: Proceedings of SPIE - The International Society for Optical Engineering , Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX. (Proceedings of SPIE - The International Society for Optical Engineering, 2018, 10708)
Conference
Grayson, J.A.; Ahmed, Z.; Irwin, K.D.; Kang, J.; Karpel, E.; Kernasovskiy, S.A.; Kuo, C.L.; Monticue, V.; Namikawa, T.; Ogburn, R.W.; Thompson, K.L.; Tolan, J.E.; Wandui, A.; Wu, W.L.K.; Yoon, K.W.; Ade, P.A.R.; Tucker, C.; Alexander, K.D.; Barkats, D.; Bischoff, C.A.; Boenish, H.; Bowens-Rubin, R.; Buder, I.; Buza, V.; Connors, J.; Harrison, S.; Karkare, K.S.; Kovac, J.M.; Richter, S.; Sorenson, C.; Vieregg, A.G.; Amiri, M.; Halpern, M.; Wiebe, D.V.; Benton, S.J.; Netterfield, C.B.; Bock, J.J.; Filippini, J.P.; Hristov, V.V.; Hui, H.; Kefeli, S.; Lueker, M.; O'Brient, R.; Staniszewski, Z.K.; Steinbach, B.; Teply, G.P.; Megerian, K.G.; Nguyen, H.T.; Turner, A.D.; Weber, A.C.; Bullock, E.; Pryke, C.; Fliescher, S.; Schwarz, R.; Sheehy, C.D.; Willmert, J.; Hilton, G.C.; Reintsema, C.D.; Leitch, E.M.
In: Proceedings of SPIE - The International Society for Optical Engineering , Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2016, 9914)
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[AR] Leitch, E.M.
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