학술논문
'학술논문'
에서 검색결과 269건 | 목록
150~160
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis . (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2000, :17-21)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA . (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 1999, :180-184)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA . (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 1999, :104-107)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis . (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 1999, :465-470)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA . (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 1999, :113-118)
Conference
In: Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA . (Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA, 1997, :270-274)
Conference
In: Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA . (Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA, 1997, :97-102)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Microelectronic Packaging and Laser Processing. (Proceedings of SPIE - The International Society for Optical Engineering, 1997, 3184:66-72)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Charged Particle Optics III. (Proceedings of SPIE - The International Society for Optical Engineering, 1997, 3155:175-184)
Conference
In: Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA . (Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA, 1997, :290-295)
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제한된 항목
[AR] Phang, J.C.H.
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