학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 269건 | 목록 150~160
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2000, :17-21)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 1999, :180-184)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 1999, :104-107)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 1999, :465-470)
Conference
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 1999, :113-118)
Conference
In: Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA. (Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA, 1997, :270-274)
Conference
In: Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA. (Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA, 1997, :97-102)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Microelectronic Packaging and Laser Processing. (Proceedings of SPIE - The International Society for Optical Engineering, 1997, 3184:66-72)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Charged Particle Optics III. (Proceedings of SPIE - The International Society for Optical Engineering, 1997, 3155:175-184)
Conference
In: Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA. (Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA, 1997, :290-295)
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제한된 항목
[AR] Phang, J.C.H.
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