학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 204건 | 목록 140~150
Academic Journal
MEASUREMENT SCIENCE AND TECHNOLOGY; FEB 2007, 18 2, p528-p531, 4p.
Academic Journal
OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS; 2007, 1 11, p620-p624, 5p.
Academic Journal
OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS; 2007, 1 10, p491-p495, 5p.
Book
In: Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro- and Nanometer Range. (Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro- and Nanometer Range, 31 March 2006, :452-462)
Conference
In: Fracture of Nano and Engineering Materials and Structures - Proceedings of the 16th European Conference of Fracture. (Fracture of Nano and Engineering Materials and Structures - Proceedings of the 16th European Conference of Fracture, 2006, :871-872)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Advances in Optical Thin Films II. (Proceedings of SPIE - The International Society for Optical Engineering, 2005, 5963)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Eighth International Symposium on Laser Metrology - Macro-, Micro, and Nanotechnologies Applied in Science, Engineering, and Industry. (Proceedings of SPIE - The International Society for Optical Engineering, 2005, 5776:717-728)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Wave-Optical Systems Engineering II. (Proceedings of SPIE - The International Society for Optical Engineering, 2004, 5182:260-271)
Academic Journal
In: Surface and Interface Analysis, European Applications of Surface and Interface Analysis - ECASIA'11. (Surface and Interface Analysis, August 2012, 44(8):1151-1154)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, 19th Congress on the International Commission for Optics Optics for the Quality of Life. (Proceedings of SPIE - The International Society for Optical Engineering, 2003, 4829 II:831-832)
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제한된 항목
[AR] Klapetek, P.
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