학술논문

A microprocessor based autoscanner for electromigration studies in thin films
Document Type
Article
Source
Pramana; November 1989, Vol. 33 Issue: 5 p541-546, 6p
Subject
Language
ISSN
03044289
Abstract
Mass transport due to electromigration can be estimated if the diffusion coefficientDand the electromigration effective charge numberZ* are known. Neutron activated tracer scanning method determine the radioactivity at different positions. An automatic scanning system for determining the radioactive concentration profiles developed using a microprocessor is described in this paper. Using the radioactive concentration profiles the electromigration shift is determined. From this shift the electromigration effective charge numberZ* is calculated. The system developed was tested for tin thin films.