학술논문
Impact of Irradiation Side on Muon-Induced Single-Event Upsets in 65-nm Bulk SRAMs
Document Type
Article
Author
Source
In: IEEE Transactions on Nuclear Science . (IEEE Transactions on Nuclear Science, 1 April 2024, 71(4):912-920)
Subject
Language
English
ISSN
15581578
00189499
00189499