학술논문

Efficient Error Detection Schemes for ECSM Window Method Benchmarked on FPGAs
Document Type
Article
Source
In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. (IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1 March 2024, 32(3):592-596)
Subject
Language
English
ISSN
15579999
10638210