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Bright-Field and Edge-Enhanced Imaging Using an Electrically Tunable Dual-Mode Metalens

Document Type

Article

Author

Badloe, T.; Kim, Y.; Kim, J.; Rho, J.; Park, H.; Barulin, A.; Diep, Y.N.; Cho, H.; Kim, I.; Kim, W.-S.; Kim, Y.-K.

Source

In: ACS Nano. (ACS Nano, 8 August 2023, 17(15):14678-14685)

Subject

Language

English

ISSN

1936086X
19360851

Online Access

Full Text (ACS) Web of Science JCR 저널정보 Scopus Find it@PNU

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