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Resonant X-ray Diffraction Reveals the Location of Counterions in Doped Organic Mixed Ionic Conductors

Document Type

Article

Author

Flagg, L.Q.; Richter, L.J.; Onorato, J.W.; Luscombe, C.K.; Bhat, V.; Risko, C.; Levy-Wendt, B.; Toney, M.F.; McNeill, C.R.; Freychet, G.; Zhernenkov, M.; Li, R.

Source

In: Chemistry of Materials. (Chemistry of Materials, 23 May 2023, 35(10):3960-3967)

Subject

Language

English

ISSN

15205002
08974756

Online Access

Full Text (ACS) Web of Science JCR 저널정보 Scopus Find it@PNU

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