학술논문
Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles
Document Type
Article
Author
Feltin, N.; Crouzier, L.; Delvallée, A.; Pellegrino, F.; Maurino, V.; Bartczak, D.; Goenaga-Infante, H.; Taché, O.; Marguet, S.; Testard, F.; Artous, S.; Saint-Antonin, F.; Salzmann, C.; Hodoroaba, V.-D.; Deumer, J.; Gollwitzer, C.; Koops, R.; Sebaïhi, N.; Fontanges, R.; Neuwirth, M.; Bergmann, D.; Hüser, D.; Klein, T.
Source
In: Nanomaterials . (Nanomaterials, March 2023, 13(6))
Subject
Language
English
ISSN
20794991