학술논문
Automated analysis of X-ray topography of 4H-SiC wafers: Image analysis, numerical computations, and artificial intelligence approaches for locating and characterizing screw dislocations
Document Type
Article
Source
In: Journal of Materials Research . (Journal of Materials Research, 14 March 2023, 38(5):1254-1265)
Subject
Language
English
ISSN
20445326
08842914
08842914