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Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples

Document Type

Article

Author

Staeck, S.; Hönicke, P.; Baumann, J.; Grötzsch, D.; Goetzke, G.; Jonas, A.; Förste, F.; Kanngießer, B.; Andrle, A.; Weser, J.; Kayser, Y.; Soltwisch, V.; Beckhoff, B.; Mantouvalou, I.; Viefhaus, J.; Stiel, H.

Source

In: Nanomaterials. (Nanomaterials, November 2022, 12(21))

Subject

Language

English

ISSN

20794991

Online Access

Full Text (Gale Academic Onefile) Full Text (ProQuest Central) Open Access (EBSCO) Web of Science JCR 저널정보 Scopus Find it@PNU

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