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Study on dark-field imaging with a laboratory X-ray source: Random stress variation analysis based on X-ray grating interferometry
Document Type
Article
Author
Lee, S.; Oh, O.; Kim, Y.; Kim, D.; Won, J.; Lee, S.W.
Source
In: Review of Scientific Instruments. (Review of Scientific Instruments, 1 January 2021, 92(1))
Subject
Language
English
ISSN
10897623
00346748

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