학술논문
Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2 O3 using Cryo-EELS
Document Type
Article
Author
Source
In: Ultramicroscopy . (Ultramicroscopy, December 2020, 219)
Subject
Language
English
ISSN
18792723
03043991
03043991