학술논문
Single-Ended-to-Differential Sampling Technique for Sigma Delta ADCs in X-Ray Detectors
Document Type
Conference Paper
Author
Source
In: Midwest Symposium on Circuits and Systems , 2019 IEEE 62nd International Midwest Symposium on Circuits and Systems, MWSCAS 2019. (Midwest Symposium on Circuits and Systems, August 2019, 2019-August:485-488)
Subject
Language
English
ISSN
15483746