학술논문
Runaway electrons diagnostics using segmented semiconductor detectors
Document Type
Article
Author
Svihra, P.; Bren, D.; Cerovsky, J.; Dhyani, P.; Farnik, M.; Ficker, O.; Havranek, M.; Hejtmanek, M.; Janoska, Z.; Kafka, V.; Linhart, V.; Marcisovska, M.; Marcisovsky, M.; Mlynar, J.; Neue, G.; Novotny, L.; Svoboda, V.; Tomasek, L.; Vancura, P.; Vrba, V.; Casolari, A.; Kulhanek, P.; Macusova, E.; Urban, J.; Varju, J.; Weinzettl, V.
Source
In: Fusion Engineering and Design . (Fusion Engineering and Design, September 2019, 146:316-319)
Subject
Language
English
ISSN
09203796