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X-ray topo-tomography studies of linear dislocations in silicon single crystals

Document Type

Article

Author

Asadchikov, V.; Buzmakov, A.; Chukhovskii, F.; Dyachkova, I.; Zolotov, D.; Danilewsky, A.; Haaga, S.; Kabukcuoglu, M.; Baumbach, T.; Hänschke, D.; Bode, S.; Balzer, M.; Caselle, M.; Suvorov, E.

Source

In: Journal of Applied Crystallography. (Journal of Applied Crystallography, December 2018, 51(6):1616-1622)

Subject

Language

English

ISSN

16005767
00218898

Online Access

Full Text (Wiley Journals) Full Text (Wiley-DB) Web of Science JCR 저널정보 Scopus Find it@PNU

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