학술논문
Profiling border-traps by TCAD analysis of multifrequency CV-curves in Al2 O3 /InGaAs stacks
Document Type
Conference Paper
Author
Source
In: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018 , 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018. (2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018, 3 May 2018, 2018-January:1-4)
Subject
Language
English