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Characterization of Nanoporous Materials with Atom Probe Tomography

Document Type

Article

Author

Pfeiffer, B.; Erichsen, T.; Epler, E.; Volkert, C.A.; Nowak, C.; Trompenaars, P.

Source

In: Microscopy and Microanalysis. (Microscopy and Microanalysis, 1 April 2015, 21(3):557-563)

Subject

Language

English

ISSN

14358115
14319276

Online Access

Full Text (Oxford University Press) Full Text (ProQuest Central) Open Access (EBSCO) Web of Science JCR 저널정보 Scopus Find it@PNU

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