학술논문

A 7-nm FinFET 1.2-TB/s/mm2 3D-Stacked SRAM Module With 0.7-pJ/b Inductive Coupling Interface Using Over-SRAM Coil and Manchester-Encoded Synchronous Transceiver
Document Type
Periodical
Source
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 58(7):2075-2086 Jul, 2023
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Computing and Processing
Random access memory
Attenuation
Through-silicon vias
Wireless communication
Inductive coupling
Saturation magnetization
Eddy currents
3D integration
3D memory
7-nm FinFET
clocked comparator
inductive coupling
Manchester encoding
static-random access memory (SRAM)
through-silicon via (TSV)
ThruChip Interface (TCI)
Language
ISSN
0018-9200
1558-173X
Abstract
A 0.7-pJ/bit, 8.5-Gb/s/link inductive coupling interchip wireless communication interface for a 3D- stacked static-random access memory (SRAM) has been developed in a 7-nm FinFET process. A new physical placement method that allows coils to be placed over off-the-shelf SRAM macros with small magnetic field attenuation, together with the use of synchronous communication using Manchester encoding and a clocked comparator to enable the detection of small-swing signals, achieves a 26% reduction in SRAM die area compared to through-silicon via (TSV)-based stacking. Interchip communication at 0.7 pJ/bit, 8.5 Gb/s/link was confirmed using test chips. A 4-hi 3D- stacked SRAM module using the proposed interface achieves a 1.2-TB/s/mm 2 area efficiency, representing a two orders-of-magnitude improvement over the state-of-the-art 3D- stacked SRAM.