학술논문

A self-sustaining Single Photon Avalanche Diode Model

Document Type

Conference

Author

Rink, S.; Quenette, V.; Manouvrier, J.R.; Juge, A.; Gouget, G.; Rideau, D.; Bianchi, R.A.; Golanski, D.; Mamdy, B.; Kammerer, J.B.; Uhring, W.; Lallement, C.; Pellegrini, S.; Agnew, M.; Rae, B.

Source

ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2022 - IEEE 52nd European. :281-284 Sep, 2022

Subject

Components, Circuits, Devices and Systems
Timing jitter
Solid modeling
Simulation
Predictive models
Impact ionization
Silicon
Semiconductor process modeling
SPAD
Verilog A
compact modelling
impact ionization
loop architecture
avalanche
breakdown
imager
CMOS

Language

Abstract

This paper is describing structure of a Single Photon Avalanche Diode (SPAD) compact model. Using a loop architecture to describe the impact ionization phenomenon, this approach yields a closer to physics SPAD model using minimal fitting adjustments and an innovative approach, hence differentiating itself from the majority of available SPAD models.

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