학술논문

Innovative Practices Track: What’s Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety
Document Type
Conference
Source
2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-1 Apr, 2022
Subject
Components, Circuits, Devices and Systems
Industries
Built-in self-test
Very large scale integration
Safety
Error correction codes
Security
Reliability
automotive
functional safety
in-field test
Error Correcting Code
Architectural Vulnerability Factor
Language
ISSN
2375-1053
Abstract
Safety is established as one of top priorities for Automotive SoCs along with security and reliability. However, testing is also known to play a crucial role since the degree of safety indirectly depends on the quality of test solution employed by SoC. In recent years, numerous studies and a large number of papers have been published on this topic, which seemed to form the necessary concepts and requirements for test solutions to achieve the desired level of functional safety. Among others, they introduced the concepts such as power-on self-test, check the checkers, mission mode test, periodic self-test, and so on. At this point, the question naturally arises whether we are hitting the limit, or we are still halfway there, and there is still room to improve field test and further enhance safety. During this session, we will ask speakers who are renowned experts in the field to share their views on the future of automotive industry and what comes next in terms of functional safety.