학술논문

A mmWave Switch Using Novel Back-End-Of-Line (BEOL) in 22nm FinFET Technology
Document Type
Conference
Source
2021 IEEE MTT-S International Microwave Symposium (IMS) Microwave Symposium (IMS), 2021 IEEE MTT-S International. :34-37 Jun, 2021
Subject
Fields, Waves and Electromagnetics
Microwave measurement
Metals
Switches
Insertion loss
FinFETs
Frequency measurement
Transistors
switches
millimeter wave integrated circuits
radio frequency integrated circuits
CMOS integrated circuits
CMOS technology
Language
ISSN
2576-7216
Abstract
This paper presents a mmWave switch designed using novel back-end-of-line (BEOL) in Intel 22nm FinFET (22FFL) technology. In the newly developed mmWave BEOL, ExpressVia is introduced, which allows direct transistor connection to thick metal layer. Continuous via and 3+1 thick metal layers are also enabled to provide design flexibility. Taking advantage of the new features, an ultra-wideband (DC-60GHz) series SPST switch is implemented in this technology achieving 1.9dB insertion loss, 21.0dB isolation, 17.3dB return loss, 24.1dBm IP1dB, 35.9dBm IIP3 at 28GHz within an active area of 0.00176mm 2 . Reliability measurements show the switch can handle up to 24.9dBm of power at 28GHz. The measured ${\mathrm{R}_{\text{on}}}^{\ast}\mathrm{C}_{\text{off}}$ at top metal is 107fs, which is well suited for emerging 5G applications.