학술논문

A Reference-Free Image Index to Simultaneously Quantify Infrared-Imaging Fixed-Pattern-Noise and Blur Artifacts
Document Type
Periodical
Source
IEEE Access Access, IEEE. 9:121593-121607 2021
Subject
Aerospace
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Fields, Waves and Electromagnetics
General Topics for Engineers
Geoscience
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Transportation
Indexes
Laplace equations
Imaging
Transducers
Kernel
Image quality
Microscopy
Infrared imaging
infrared imaging index
non-uniformity noise
plenoptic
infrared microscopy
Language
ISSN
2169-3536
Abstract
A reference-free image index to jointly assess infrared-imaging fixed-pattern-noise and blur artifacts is proposed in this work. The proposed index is based on tuned-spatial-domain filtering, which works by combining two Laplace operators to simultaneously quantify the global infrared-imaging fixed-pattern-noise and the global or local blur artifacts. The index effectiveness is demonstrated by two task-based image-quality assessments to determine the focused and fixed-pattern-noise free images from sequences captured with both a mid-wave-infrared microscope system and a long-wave-infrared plenoptic system. The index quantitative limits are shown on numerical computations over synthetic corrupted images as well as real black-body radiator calibrated infrared images with representative simulated fixed-pattern noise, from six well known infrared focal plane arrays transducer technologies, along with artificial blur added using real infrared imaging system point spread functions.