학술논문

Compact Modeling of the Switching Dynamics and Temperature Dependencies in TiOₓ-Based Memristors—Part I: Behavioral Model
Document Type
Periodical
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(10):4877-4884 Oct, 2021
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Memristors
Switches
Resistance
Temperature measurement
Temperature dependence
Computational modeling
Electrical resistance measurement
Behavioral model
metal oxide memristors
pulsed resistance transient (PRT) measurements
resistive RAMs switching dynamics
temperature dependence
ₓ<%2Fitalic>+memristors%22">TiO memristors
Language
ISSN
0018-9383
1557-9646
Abstract
Memristor is a promising device as a fundamental building block for future unconventional system architectures such as neuromorphic computing, reconfigurable logic, and multibit memories. Therefore, to facilitate circuit design using memristors, accurate and efficient models spanning a wide range of programming voltages and temperatures are required. In the first part of this series, we propose a behavioral model for temperature dependence of nonvolatile switching dynamics of TiO x memristors. We begin by describing pulsed resistance transients (PRTs) of the memristors and then we use a multistage methodology to establish bias and temperature dependence of the model parameters. The proposed model is then shown to accurately describe the PRT characteristics of Pt/TiO x /Au and Pt/TiO x /Pt memristors.